<?xml version="1.0" encoding="UTF-8"?>
<!DOCTYPE article PUBLIC "-//NLM//DTD JATS (Z39.96) Journal Publishing DTD v1.3 20210610//EN" "JATS-journalpublishing1-3.dtd">
<article article-type="research-article" dtd-version="1.3" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xml:lang="ru"><front><journal-meta><journal-id journal-id-type="publisher-id">techusgu</journal-id><journal-title-group><journal-title xml:lang="ru">Известия Юго-Западного государственного университета. Серия: Техника и технологии</journal-title><trans-title-group xml:lang="en"><trans-title>Proceedings of the Southwest State University. Series: Engineering and Technology</trans-title></trans-title-group></journal-title-group><issn pub-type="ppub">2223-1528</issn><publisher><publisher-name>Юго-Западный государственный университет</publisher-name></publisher></journal-meta><article-meta><article-id pub-id-type="doi">10.21869/2223-1528-2025-15-2-113-131</article-id><article-id custom-type="elpub" pub-id-type="custom">techusgu-347</article-id><article-categories><subj-group subj-group-type="heading"><subject>Research Article</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="ru"><subject>ФИЗИКА</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="en"><subject>PHYSICS</subject></subj-group></article-categories><title-group><article-title>Структурные и морфологические особенности магнетронных пленок теллурида висмута n-типа проводимости ВЧ МР</article-title><trans-title-group xml:lang="en"><trans-title>Structural and morphological features of magnetron films of bismuth telluride of n-type conductivity RF MR</trans-title></trans-title-group></title-group><contrib-group><contrib contrib-type="author" corresp="yes"><contrib-id contrib-id-type="orcid">https://orcid.org/0000-0001-7089-0692</contrib-id><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Кузьменко</surname><given-names>А. П.</given-names></name><name name-style="western" xml:lang="en"><surname>Kuzmenko</surname><given-names>A. P.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Кузьменко Александр Павлович, доктор физико-математических наук, профессор, главный научный сотрудник Регионального центра нанотехнологий</p><p>ул. 50 лет Октября, д. 94, г. Курск 305040</p></bio><bio xml:lang="en"><p>Aleksander P. Kuzmenko, Doctor of Sciences (Physics and Mathematics), Professor, Chief Researcher of the Regional Center for Nanotechnology</p><p>50 Let Oktyabrya Str. 94, Kursk 305040</p></bio><email xlink:type="simple">apk3527@mail.ru</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><contrib-id contrib-id-type="orcid">https://orcid.org/0009-0004-8571-8544</contrib-id><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Колпаков</surname><given-names>А. И.</given-names></name><name name-style="western" xml:lang="en"><surname>Kolpakov</surname><given-names>A. Ig.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Колпаков Артем Игоревич, аспирант</p><p>ул. 50 лет Октября, д. 94, г. Курск 305040</p></bio><bio xml:lang="en"><p>Artem Ig. Kolpakov, Postgraduate Student</p><p>50 Let Oktyabrya Str. 94, Kursk 305040</p></bio><email xlink:type="simple">artem.kolpakov.96@mail.ru</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Матарыкин</surname><given-names>К. А.</given-names></name><name name-style="western" xml:lang="en"><surname>Matarykin</surname><given-names>K. A.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Матарыкин Константин Александрович, студент кафедры нанотехнологий, микроэлектроники, общей и прикладной физики</p><p>ул. 50 лет Октября, д. 94, г. Курск 305040</p></bio><bio xml:lang="en"><p>Konstantin A. Matarykin, Student of the Department of Nanotechnology, Mictroelectronics, General and Applied Physics</p><p>50 Let Oktyabrya Str. 94, Kursk 305040</p></bio><email xlink:type="simple">icego132@gmail.ru</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><contrib-id contrib-id-type="orcid">https://orcid.org/0000-0002-1893-1941</contrib-id><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Родионов</surname><given-names>В. В.</given-names></name><name name-style="western" xml:lang="en"><surname>Rodionov</surname><given-names>V. V.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Родионов Владимир Викторович, кандидат физико-математических наук, старший научный сотрудник Регионального центра нанотехнологий</p><p>ул. 50 лет Октября, д. 94, г. Курск 305040</p></bio><bio xml:lang="en"><p>Vladimir V. Rodionov, Candidate of Science (Physics and Mathematics), Senior Researcher of the Regional Center of Nanotechnology</p><p>50 Let Oktyabrya Str. 94, Kursk 305040</p></bio><email xlink:type="simple">vovarodionov2009@yandex.ru</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><contrib-id contrib-id-type="orcid">https://orcid.org/0000-0002-1803-5928</contrib-id><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Иванов</surname><given-names>О. Н.</given-names></name><name name-style="western" xml:lang="en"><surname>Ivanov</surname><given-names>O. N.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Иванов Олег Николаевич, доктор физико-математических наук, ведущий научный сотрудник лаборатории перспективных материалов и технологий</p><p>ул. Победы, д. 85, г. Белгород 308015</p></bio><bio xml:lang="en"><p>Oleg N. Ivanov, Doctor of Science (Physics and Mathematics), Leading Researcher at the Laboratory of Advanced Materials and Technologies</p><p>85 Pobeda Str., Belgorod 308015 </p></bio><email xlink:type="simple">ivanov.oleg@bsu.edu.ru</email><xref ref-type="aff" rid="aff-2"/></contrib><contrib contrib-type="author" corresp="yes"><contrib-id contrib-id-type="orcid">https://orcid.org/0000-0001-8791-8102</contrib-id><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Япрынцев</surname><given-names>М. Н.</given-names></name><name name-style="western" xml:lang="en"><surname>Yapryntsev</surname><given-names>M. N.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Япрынцев Максим Николаевич, кандидат физико-математических наук, научный сотрудник ЦКП «Технологии и материалы»</p><p>ул. Победы, д. 85, г. Белгород 308015</p></bio><bio xml:lang="en"><p>Maksim N. Yapryntsev, Candidate of Science (Physics and Mathematics), Researcher at the Center for Collective Use "Technologies and Materials"</p><p>85 Pobeda Str., Belgorod 308015 </p></bio><email xlink:type="simple">yaprintsev@bsu.edu.ru</email><xref ref-type="aff" rid="aff-2"/></contrib></contrib-group><aff-alternatives id="aff-1"><aff xml:lang="ru"><institution>Юго-Западный государственный университет</institution><country>Россия</country></aff><aff xml:lang="en"><institution>Southwest State University</institution><country>Russian Federation</country></aff></aff-alternatives><aff-alternatives id="aff-2"><aff xml:lang="ru"><institution>Белгородский государственный национальный исследовательский университет</institution><country>Россия</country></aff><aff xml:lang="en"><institution>Belgorod State National Research University</institution><country>Russian Federation</country></aff></aff-alternatives><pub-date pub-type="collection"><year>2025</year></pub-date><pub-date pub-type="epub"><day>08</day><month>08</month><year>2025</year></pub-date><volume>15</volume><issue>2</issue><fpage>113</fpage><lpage>131</lpage><permissions><copyright-statement>Copyright &amp;#x00A9; Кузьменко А.П., Колпаков А.И., Матарыкин К.А., Родионов В.В., Иванов О.Н., Япрынцев М.Н., 2025</copyright-statement><copyright-year>2025</copyright-year><copyright-holder xml:lang="ru">Кузьменко А.П., Колпаков А.И., Матарыкин К.А., Родионов В.В., Иванов О.Н., Япрынцев М.Н.</copyright-holder><copyright-holder xml:lang="en">Kuzmenko A.P., Kolpakov A.I., Matarykin K.A., Rodionov V.V., Ivanov O.N., Yapryntsev M.N.</copyright-holder><license xml:lang="ru" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>Данная работа распространяется под лицензией Creative Commons Attribution 4.0.</license-p></license><license xml:lang="en" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>This work is licensed under a Creative Commons Attribution 4.0 License.</license-p></license></permissions><self-uri xlink:href="https://techusgu.elpub.ru/jour/article/view/347">https://techusgu.elpub.ru/jour/article/view/347</self-uri><abstract><p>Цель исследования. Характеризация нанопленок теллурида висмута n-типа проводимости из мишени Bi2Te2,7Se0,3, формируемых методом высокочастотного магнетронного распыления в среде Ar на кремниевой подложке.Методы. Высокочастотное магнетронное распыление на подложку из кремния осуществлялось в зависимости от изменений управляющих параметров (мощности P = 50 – 80 Вт и времени t = 1800 – 2700 с) распыления. Характеризация магнетронных нанопленок проводилась методами рентгенофазового анализа, атомно-силовой микроскопии, сканирующей электронной микроскопии, микрорентгеноспектрального энергодисперсионного анализа, цифровой голографической микроскопии и комбинационного (рамановского) рассеяния света. Проводилась статистическая обработка АСМ-изображений МНП с построением автокорреляционных функций по прямому преобразованию Фурье, анализ изменений фрактальных размерностей МНП.Результаты. Прецизионно с применением АСМ, ЦГМ, СЭМ и специально разработанной методики по ЭДА измерены толщины и рассчитаны скорости роста МНП, доказано их линейное увеличение в зависимости от P и t. По данным КРС и РФА установлено, что в процессе ВЧ МР Bi2Te2,7Se0,3 формируются поликристаллические МНП, кристалличность которых была достигнута после отжига при 623 К. По дифрактограммам РФА рассчитаны размеры областей когерентности, текстурированности, микродеформаций и межплоскостных деформационных искажений МНП. Проведена статистическая обработка АСМ-изображений МНП с определением фрактальной размерности и построением по ППФ АКФ. Доказано, что МНП имеют 3Dмерность и формируются, подчиняясь смешанному механизму Странского – Крастанова.Заключение. В магнетронных нанопленках Bi2Te3 n-проводимости обнаружены деформации обоих знаков: как сжимающие (∆а &lt; 0), так и растягивающие (∆a &gt; 0). Расчетные размеры когерентности согласуются с низким уровнем кристалличности и слабо зависят от роста как P, так и t. По измерениям методом «ступеньки» толщины МНП скорость их формирования составила V ≈ 0,6 нм/с.</p></abstract><trans-abstract xml:lang="en"><p>Purpose of research. Characterization of n-type bismuth telluride nanofilms from the Bi2Te2,7Se0,3 target formed by high-frequency magnetron sputtering in Ar on a silicon substrate.Methods. High-frequency magnetron sputtering on a silicon substrate was carried out depending on changes in the control parameters (power P = 50 – 80 W and time t = 1800 – 2700 s) of sputtering. Characterization of magnetron nanofilms was carried out by X-ray phase analysis, atomic force microscopy, scanning electron microscopy, energydispersive X-ray microanalysis, digital holographic microscopy and Raman scattering. Statistical processing of AFM images of MNFs with the construction of autocorrelation functions using the direct Fourier transform, analysis of changes in the fractal dimensions of MNFsResults. Thicknesses were measured with precision using AFM, DHM, SEM and a specially developed EDS technique, and the growth rates of MNFs were calculated, their linear increase depending on P, and t was proven. According to the Raman and XRD data, it was found that polycrystalline MNFs are formed in the process of RF MR of Bi2Te2,7Se0,3, the crystallinity of which was achieved after annealing at 623 K. The sizes of the coherence regions, texturing, microstrains and interplanar deformation distortions of MNFs were calculated using the XRD patterns. Statistical processing of AFM images of MNFs was carried out with the determination of the fractal dimension and the construction of the ACF using the DFT. It is proved that MNFs have 3D dimensions and are formed by the mixed Stranski – Krastanov mechanism.Conclusion. In magnetron sputtered Bi2Te3 nanofilms with n-type conductivity, deformations of both signs were found: both compressive (∆а &lt; 0) and tensile (∆a &gt; 0). The calculated coherence sizes are consistent with the low level of crystallinity and weakly depend on the growth of both P and t. According to measurements by the “step” method of MNF thickness, the rate of their formation was V ≈ 0,6 nm/s.</p></trans-abstract><kwd-group xml:lang="ru"><kwd>высокочастотное магнетронное распыление</kwd><kwd>магнетронные нанопленки</kwd><kwd>проводимость n-типа</kwd><kwd>механизм Странского – Крастанова</kwd></kwd-group><kwd-group xml:lang="en"><kwd>high-frequency magnetron sputtering</kwd><kwd>magnetron nanofilms</kwd><kwd>n-type conductivity</kwd><kwd>Stranski – Krastanov mechanism</kwd></kwd-group><funding-group><funding-statement xml:lang="ru">Статья подготовлена в рамках государственного заказа на 2025 г. № 075-03-3025-526.</funding-statement></funding-group></article-meta></front><back><ref-list><title>References</title><ref id="cit1"><label>1</label><citation-alternatives><mixed-citation xml:lang="ru">High ZT and performance controllable thermoelectric devices based on electrically gated bismuth telluride thin films / Dongli Qin, Feng Pan, Jie Zhou, Zibo Xu, Yuan Deng // Nano Energy. 2021. 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